TLP/VF-TLP Calibration Substrate
Features
- High quality ceramic substrate for TLP/VF-TLP system wafer-level calibration using ground-signal (GS) RF probes
- Probetip pitch range from 50 µm up to 3 mm
- 8 reference resistors in the range of 0.1, 0.2, 0.5, 1, 5, 10, 50 and 100 Ω for calibration of the current measurement channel
- 5 reference Z-diodes in the range of 5, 7, 10, 18 and 33 V for calibration of the voltage measurement channel. Optional 68 V and 120 V Z-diodes in addition for high voltage calibration applications
- 1 silicon transient voltage suppressor (TVS) diode for reference measurement of the calibrated TLP/VF-TLP system
- 45 open-load and 45 short-circuit teststructures
- 9 (7 on HV option) custom reference device locations
- Rugged top layer metal hard gold coating
- Size 30.67 mm x 29.33 mm
- Protective case
- Calibration datasheet
Download: Product Datasheet CAL-K-3010/3011C
TLP/VF-TLP Ceramic Calibration Substrate (Size 30.67 mm x 29.33 mm)
Protective Case
