Software and Hardware R&D
Measurement Techniques
| 2009 | : | Co-founder of the High Power Pulse Instruments GmbH |
| 2006 – 2009 | : | Infineon Automotive Power Semiconductor Division: research on system-level ESD in high voltage BCD technologies. |
List of Publications
D. Johnsson, W. Mamanee, S. Bychikhin, D. Pogany, E. Gornik, and M. Stecher, “Second breakdown behavior in bipolar esd protection devices during low current long duration stress and its relation to moving current-tubes,” in 2008 IEEE International Reliability Physics Symposium, Apr. 2008, pp. 240–246. DOI: 10.1109/RELPHY.2008.4558893.
V. Issakov, D. Johnsson, Y. Cao, M. Tiebout, M. Mayerhofer, W. Simburger, and L. Maurer, “Esd concept for high-frequency circuits,” in EOS/ESD 2008 – 2008 30th Electrical Overstress/Electrostatic Discharge Symposium, Sep. 2008, pp. 221–227.
Y. Cao, W. Simburger, and D. Johnsson, “Rise-time filter design for transmission-line pulse measurement systems,” in 2009 German Microwave Conference, Mar. 2009, pp. 1–5. DOI: 10.1109/GEMIC.2009.4815848.
D. Johnsson, M. Mayerhofer, J. Willemen, U. Glaser, D. Pogany, E. Gornik, and M. Stecher, “Avalanche breakdown delay in high-voltage p-n junctions caused by pre-pulse voltage from iec 61000-4-2 esd generators,” IEEE Transactions on Device and Materials Reliability, vol. 9, no. 3, pp. 412–418, Sep. 2009, ISSN: 1558-2574. DOI: 10.1109/TDMR.2009.2023513.
D. Pogany, D. Johnsson, S. Bychikhin, K. Esmark, P. Rodin, E. Gornik, M. Stecher, and H. Gossner, “Nonlinear dynamics approach in modeling of the on-state-spreading – related voltage and current transients in 90nm cmos silicon controlled rectifiers,” in 2009 IEEE International Electron Devices Meeting (IEDM), Dec. 2009, pp. 1–4. DOI: 10.1109/IEDM.2009.5424308.
Y. Cao, D. Johnsson, B. Arndt, and M. Stecher, “A tlp-based human metal model esd-generator for device qualification according to iec 61000-4-2,” in 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility, Apr. 2010, pp. 471–474. DOI: 10.1109/APEMC.2010.5475621.
D. Johnsson, D. Pogany, J. Willemen, E. Gornik, and M. Stecher, “Avalanche breakdown delay in esd protection diodes,” IEEE Transactions on Electron Devices, vol. 57, no. 10, pp. 2470–2476, Oct. 2010, ISSN: 1557-9646. DOI: 10.1109/TED.2010.2058790.
J. Willemen, D. Johnsson, Y. Cao, and M. Stecher, “A tlp-based characterization method for transient gate biasing of mos devices in high-voltage technologies,” in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, Oct. 2010, pp. 1–10.
D. Pogany, D. Johnsson, S. Bychikhin, K. Esmark, P. Rodin, M. Stecher, E. Gornik, and H. Gossner, “Measuring holding voltage related to homogeneous current flow in wide esd protection structures using multilevel tlp,” IEEE Transactions on Electron Devices, vol. 58, no. 2, pp. 411–418, Feb. 2011, ISSN: 1557-9646. DOI: 10.1109/TED.2010.2093143.
D. Johnsson and H. Gossner, “Study of system esd codesign of a realistic mobile board,” in EOS/ESD Symposium Proceedings, Sep. 2011, pp. 1–10.
W. Mamanee, S. Bychikhin, D. Johnsson, N. Jensen, M. Stecher, E. Gornik, and D. Pogany, “Effect of elevated ambient temperature on thermal breakdown behavior in bcd esd protection devices subjected to long electrical overstress pulses,” IEEE Transactions on Device and Materials Reliability, vol. 12, no. 3, pp. 562–569, Sep. 2012, ISSN: 1558-2574. DOI: 10.1109/TDMR.2012.2193884.
H. Li, C. C. Russ, W. Liu, D. Johnsson, H. Gossner, and K. Banerjee, “Esd characterization of atomically-thin graphene,” in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012, Sep. 2012, pp. 1–8.
——, “On the electrostatic discharge robustness of graphene,” IEEE Transactions on Electron Devices, vol. 61, no. 6, pp. 1920–1928, Jun. 2014, ISSN: 1557-9646. DOI: 10.1109/TED.2014.2315235.
B. Orr, D. Johnsson, K. Domanski, H. Gossner, and D. Pommerenke, “A passive coupling circuit for injecting tlp-like stress pulses into only one end of a driver/receiver system,” in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Sep. 2015, pp. 1–8. DOI: 10.1109/EOSESD.2015.7314800.
D. Johnsson, K. Domanski, and H. Gossner, “Device failure from the initial current step of a cdm discharge,” in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Sep. 2018, pp. 1–7. DOI: 10.23919/EOS/ESD.2018.8509779.